05-002/4 - Model-based Measurement of Actual Volatility in High-Frequency Data
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                                        AuthorsB. Jungbacker, Faculty of Economics and Business Administration, Vrije Universiteit Amsterdam; S.J. Koopman, Faculty of Economics and Business Administration, Vrije Universiteit Amsterdam
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                                            Publication dateJanuary 5, 2005
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                                            KeywordsImportance sampling; Maximum likelihood estimation; Micro-structure noise; Realised variance; Stochastic volatility model
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                                            JELC22; C53; G15